Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

The Fraunhofer Institute for Photonic Microsystems (IPMS), in collaboration with DIVE imaging systems , has achieved a major milestone in resource-efficient semiconductor manufacturing. With the ...