Shin Horiuchi (Senior Research Scientist), the Research Group for Nanoscientific Measurements (Leader: Junichi Murakami), the Nanotechnology Research Institute (Director: Nobutsugu Minami) of the ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope.

A team of researchers at the University of Victoria (UVic) have achieved a major breakthrough in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented ...

With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, Goethe University in Frankfurt (Germany) is expanding its research infrastructure with a ...

The joint development team of Professor Shibata (the University of Tokyo), JEOL Ltd. and Monash University succeeded in directly observing an atomic magnetic field, the origin of magnets (magnetic ...

In conventional electron microscopes, performing atomic-resolution observations of magnetic materials is particularly difficult because high magnetic fields are inevitably exerted on samples inside ...

An aged care facility in Queensland, Australia, has launched what it describes as the ...

A remarkable prehistoric hammer made from elephant bone, dating back nearly half a million years ago, has been uncovered in southern England and analyzed by archaeologists from UCL and the Natural ...

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...

Optical and scanning electron microscope images of a nano-LED device that uses AC power instead of DC power, which could be a game-changer for sharper near-eye displays. Journalists may use this image ...

The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...